OSTRENKO, V. S.; VASILENKO, O. V. Determination of temperature of the thyristor semiconductor structure under cyclic loading. Electrical Engineering and Power Engineering, [S. l.], n. 1, p. 13–16, 2012. DOI: 10.15588/1607-6761-2012-1-3. Disponível em: https://ee.zp.edu.ua/article/view/90356. Acesso em: 29 nov. 2024.